图片 型号 品牌 描述 Factory Lead Time 库存 操作
SN74BCT8373ADW Texas Instruments
IC SCAN TEST DEVI...
1-3 days
RFQ
5,081
In-stock
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SN74BCT8373ADWRG4 Texas Instruments
IC SCAN TEST DEVI...
1-3 days
RFQ
5,167
In-stock
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SN74BCT8373ADWR Texas Instruments
IC SCAN TEST DEVI...
1-3 days
RFQ
5,931
In-stock
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SN74BCT8373ADWRE4 Texas Instruments
IC SCAN TEST DEVI...
1-3 days
RFQ
6,674
In-stock
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SN74BCT8373ANT Texas Instruments
IC SCAN TEST DEVI...
1-3 days
RFQ
7,115
In-stock
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